Workshop

ECPE Workshop: Power Semiconductor Robustness – What Kills Power Devices?

Date: 24/06/2009 - 25/06/2009

Location: Munich, Germany

Technical Chair:

Prof. Dieter Silber, Universität Bremen
Thomas Harder, ECPE e.V.

Members Area

All proceedings since 2004, studies, reports and more... ECPE Network Members are welcome to register!

Login not necessary for event online-registration!

ECPE Workshop: Power Semiconductor Robustness – What Kills Power Devices?

The robustness of devices and systems characterizes their capability to cope with incidental stress and operation beyond normal conditions without or with only minimal damage. The main focus of the workshop concerns discrete power devices. Robustness can be achieved by suitable device layout, smart control and auxiliary components. All methods are closely interrelated with each other.

The workshop is planned as a forum for discussions of both the system requirements and the device limitations. The system engineer will describe the worst case operating mode and the device specialists will explain the device destruction mechanisms and also, which problems might be solved by future device development. It should also be considered which new problems might occur due to new developments in power electronic systems and devices, especially for high power density design and elevated temperatures. This should also help to specify appropriate research topics.

There will be about 5–10 minutes of discussion after each lecture and a final panel discussion. We encourage active contribution of all attendees and we would accept a limited number of short-time (ca. 3 min.) presentations including 2-3 viewgraphs for the panel discussion.

The attendees could also send some particular questions which we ask the experts to answer in the lectures or in the panel discussion, but we should receive them before May 29th, 2009.

The workshop is organized by Prof. Dieter Silber (University Bremen, Germany) and Thomas Harder (ECPE e.V.).

All presentations and discussions will be in Eng­lish.

Workshop

ECPE Workshop: Power Semiconductor Robustness – What Kills Power Devices?

Date: 24/06/2009 - 25/06/2009

Location: Munich, Germany

Technical Chair:

Prof. Dieter Silber, Universität Bremen
Thomas Harder, ECPE e.V.

Postal address ECPE e.V.:
ECPE European Center for Power Electronics e.V.
Ostendstrasse 181
D-90482 Nuremberg, Germany
Phone: +49 (0)911 81 02 88-0

Subscribe to the ECPE News

 

© 2018 ECPE European Center for Power Electronics e.V.