In continuation of the ECPE Workshop “Lifetime Modeling and Simulation” held last year in Dusseldorf reliability testing is in focus this time. One of the major challenges is that with increasing quality and reliability of products, test times are increasing as well. Another one is to get knowledge about mission profiles in the field.
Although automotive power and microelectronics are pushing processes and standards the test philosophy remains the same for all branches.
Guidance on Relationship of Robustness Validation to AEC-Q101 (REV-D1 September 6, 2013)
A qualification method has recently been developed with the intent of addressing application specific operations. Called Robustness Validation, this method considers the specific environmental and operational application conditions and the customer lifetime requirements to calculate the minimum required set of qualification test conditions, durations and sample sizes. It also utilizes a reliability knowledge matrix that identifies likely failure mechanisms associated with the application and part specifics.

The AEC qualification requirements are used as a baseline of test conditions and durations in the field of automotive electronics. It is intended to cover the majority of the application areas in terms of use time and loading.Test results, however, cannot stand alone – lifetime simulations have to be available for comparisons and further extended simulations.

The workshop is chaired by Prof. Eckhard Wolfgang (ECPE), Andreas Schletz (Fraunhofer IISB),
Dr. Max Poech (Fraunhofer ISIT) and Thomas Harder (ECPE).

All presentations and discussions will be in English.

There will be a table top exhibition in the frame of the workshop:

• Testinverter for Film Capacitors, Alpitronic
• High Voltage HRTB and PC Testing, SET GmnH
• Power Cycling Tester, Ingenieurbüro Schletz
• T3Ster, TIM Tester, Mentor Graphics
• Nondestructive SOA Testing, University of Cassino and Southern Lazio
• HALT, HASS Testing, NN