This workshop is dedicated to failure analysis tools and methods in power electronics. The main purpose is to give practical cases with non-destructive methods and destructive methods. During the two days, some equipment will be presented like de-packaging process, photo-emission microscopy (PEM), laser stimulation (OBIRCH), …as non-destructive method and Scanning Electron Microscopy (SEM), Focused Ion Beam (FIB) and Transmission Electron Microscopy (TEM) analysis as destructive methods.
These are key know-hows for reliability study of wide bang gap devices in power electronic applications. Some live demonstrations on equipment are scheduled depending on the number of participants (remote video-based demonstrations as back-up).
Examples concern but not exclusively the electrostatic discharge in Schottky diode, presented in order to illustrate the entire methodology. Other cases should be discussed in front of Posters.

The workshop is chaired by Prof. Bruno Allard (Ampere Insa Lyon), Dr. Olivier Latry (GPM University of Normandy) and Thomas Harder (ECPE)

All presentations and discussions will be in English.