This two-day workshop will delve into the robustness of power semiconductors in demanding applications, focusing on their performance under extreme conditions. One day will focus on cosmic ray robustness, exploring the impact of radiation on semiconductor performance. Experts from both industry and academia will present the latest advancements in radiation-hardened materials, design techniques, and testing methodologies. The workshop will encourage a comprehensive understanding of how to design and test power semiconductors for long-term reliability and safety in extreme environments.

The other day will focus on short circuit robustness, examining the ability of power semiconductors to handle fault conditions, such as overcurrent and short circuits, which are critical for ensuring reliability. The influence of short-circuit on lifetime aspects will be discussed

This event addresses experts and researchers seeking to deepen their knowledge of power semiconductor durability in critical applications.

All presentations and discussions will be in English.