The robustness or “ruggedness” of devices and systems characterizes their capability to cope with incidental stress and operation beyond normal conditions without or with only minimal damage. The main focus of the workshop concerns discrete power devices. Robustness can be achieved by suitable device layout, smart control and auxiliary components. All methods are closely interrelated with each other.

This Workshop was organised the first time in 2009. Since that time, system, device and device control have been developed to increased power density, device temperatures and ruggedness. Therefore we have decided to repeat it in 2012.

We have added a new topic which is related to the previous one, concerning the states of “killed“ devices or modules. This topic was estimated as especially important for system safety. Therefore we have provided time for both a panel discussion and general comments.

The workshop is intended as a forum for discussions of both the system requirements and the device limitations. The system engineer will describe the worst case operating mode and the device specialists will explain the device destruction mechanisms and also, which problems might be solved by future device development. It should also be considered which new problems might occur due to ongoing developments in power electronic systems and devices. This could also help to specify appropriate research topics.

There will be about 5–10 min. of discussion after each lecture and
additionally general discussions. We encourage active contributions of attendees. If attendees would like to present additional viewgraphs for discussion, they should tell us before.

The workshop is organized by Prof. Dieter Silber (University Bremen, Germany), Prof. Dr. Leo Lorenz (ECPE e.V.) and Thomas Harder (ECPE e.V.).

All presentations and discussions will be in English.