The ECPE Network - page 122

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University of Innsbruck
Overview
The University of Innsbruck is a public uni-
versity. It was founded in 1669 and is the
biggest and most important research and
education institution in western Austria
and comprises today more than 28.000
students and more than 4.500 staff and
faculty members. Located in the heart of
the Alps, the University of Innsbruck offers
the best conditions for successful research
and teaching, and international rankings
confirm the University’s leading role in
basic research.
The group of Microelectronics and Im-
plantable Systems (MEIS) enjoys a strong
national and international reputation for
its competences in analog and application
specific integrated circuit design.
Project partners benefit not only from
the group’s extensive expertise in semi-
conductor engineering, circuit topologies
and architectures but also from its com-
prehensive laboratory and measurement
equipment.
ASIC-Design
When it comes down to the design and
development of circuit components, ca-
pacitive and inductive DC/DC convert-
ers, gate drives and temperature sensors
are listed among the key competences in
MEIS’s portfolio. Furthermore, semicon-
ductor development is possible in either
Si CMOS / LDMOS, SiGe or GaAs tech-
nology applying node sizes ranging from
350 to 55 nm. Circuit design capabilities
include simulation over process, voltage
and temperature corners as well as yield
estimation based on monte carlo evalu-
ations.
Anechoic Chamber
Further, radiated emissions are investigat-
ed in an anechoic chamber enabling non-
reflective, high precision measurements.
Hereby, self-interference due to internal
backscatter of electromagnetic waves
is excluded by an absorptive chamber
interior. Likewise, external noise sources
are shielded away from the devices
under test.
On-Wafer measurements
Additionally, a semiautomatic wafer-
prober executes on-wafer tests on scales
from single dice up to 300 mm wafer
sizes. At the same time, the tempera-
ture behavior up to 200 °C can be deter-
mined if so desired.
In general, the scope of engineering
and measurement possibilities allows for
high-precision design, verification and
validation of appliances and thus also for
yield optimization of integrated circuits.
Everything combined makes MEIS a high
achiever and an excellent choice for
research and development.
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