Workshop
Date: 18/11/2026 - 19/11/2026
Location: Berlin, Germany
Technical Chair:
Francesco Iannuzzo, Polytechnic of Turin (IT)
Stefan Schmitt, Semikron Danfoss (DE)
ECPE Contact:
Svenja Roth
+49 911 81 02 88 - 12
svenja.roth@ecpe.org
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Registration Deadline: 11 November 2026
Power electronics is the enabler of all key modern energy systems, including renewable energy, e-mobility, industrial automation, and data infrastructure, especially for Artificial Intelligence. Therefore, ensuring efficient and reliable electricity conversion and conditioning is on the agenda of all countries worldwide.This expert-level workshop brings together leading researchers and industry professionals to address key challenges in robustness validation and reliability of modern power electronic systems.
It offers a platform for in-depth technical exchange, linking fundamental material behaviour to device performance and system-level operation under demanding conditions. The workshop will explore how evolving validation frameworks and reliability methodologies can keep pace with emerging technologies. Focus will be placed on next-generation semiconductor materials, whose distinct characteristics introduce new opportunities as well as complex reliability concerns that require advanced understanding.
Speakers will examine how material interactions, design choices, and operational stresses contribute to failure mechanisms, with emphasis on physics-based approaches to degradation. These insights are essential for improving the long-term performance of increasingly integrated and high-performance systems.
Environmental influences and operational stresses will be addressed through discussion of advanced testing strategies, including new accelerated life testing concepts that better resemble real-world conditions. The impact of harsh environments and contamination will be considered alongside methods to assess and mitigate their effects on system durability. The integration of experimental techniques with modeling and simulation will form a central theme, enabling deeper insight into damage evolution and supporting predictive lifetime assessment.
In addition, the reliability of supporting components and assemblies will be discussed, highlighting challenges in ensuring consistent performance across complex architectures. Particular attention will be given to mechanisms such as crack initiation and propagation, and their role in system degradation. By combining theoretical insights, experimental results, and application-driven perspectives, this workshop provides a comprehensive view of reliability engineering, equipping participants to design and validate more robust and resilient power electronic systems.
Workshop
Date: 18/11/2026 - 19/11/2026
Location: Berlin, Germany
Technical Chair:
Francesco Iannuzzo, Polytechnic of Turin (IT)
Stefan Schmitt, Semikron Danfoss (DE)
ECPE Contact:
Svenja Roth
+49 911 81 02 88 - 12
svenja.roth@ecpe.org
Postal address ECPE e.V.:
ECPE European Center for Power Electronics e.V.
Ostendstrasse 181
D-90482 Nuremberg, Germany
Phone: +49 (0)911 81 02 88-0
© 2018 ECPE European Center for Power Electronics e.V.